Download PDF High Performance Silicon Imaging: Fundamentals and Applications of CMOS and CCD sensors (Woodhead Publishing Series in Electronic and Optical Materials)
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High Performance Silicon Imaging: Fundamentals and Applications of CMOS and CCD sensors (Woodhead Publishing Series in Electronic and Optical Materials)
Download PDF High Performance Silicon Imaging: Fundamentals and Applications of CMOS and CCD sensors (Woodhead Publishing Series in Electronic and Optical Materials)
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From the Back Cover
Silicon imaging is a fast growing area of the semiconductor industry. Its use in cell phone cameras is already well established, and emerging applications include web, security, automotive and digital cinema cameras. High performance silicon imaging covers the fundamentals of silicon image sensors, with a focus on existing performance issues and potential solutions. It then considers several applications for the technology. Part I begins with a review of the fundamental principles of photosensing and the operational principles of silicon image sensors. It then focuses in on charged coupled device (CCD) image sensors and metal-oxide-semiconductor (CMOS) images sensors. The performance issues considered include image quality, sensitivity, data-transfer rate, system level integration, rate of power consumption and the potential for 3D imaging. Part II then provides a detailed discussion of how CMOS technology can be used in a range of areas, including in mobile devices, image sensors for automotive applications, sensors for several forms of scientific imaging, and sensors for medical applications. High performance silicon imaging will be an excellent resource for both academics and engineers working in the optics, photonics, semiconductor and electronics industries. Daniel Durini is the leader of a staff unit at the Central Institute for Engineering, Electronics and Analytics (ZEA-2) of the Forschungszentrum Jülich. He is an author of more than 45 papers and the holder of two patents in the area of CMOS photosensors.
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About the Author
Daniel Durini is currently Research Professor in areas of microelectronics and radiation detection at the National Institute of Astrophysics, Optics and Electronics (INAOE) in Puebla, Mexico. He obtained the B.Sc. degree in Electrical-Electronic Engineering from the National Autonomous University of Mexico (UNAM) in 2002, the M.Sc. degree in area of Microelectronics from the National Institute of Astrophysics, Optics and Electronics in Mexico in 2003, and the Ph.D. degree in area of Microelectronics from the University of Duisburg-Essen in Germany in 2009. He was with the Fraunhofer Institute for Microelectronic Circuits and Systems (IMS) in Duisburg, Germany, between 2004 and end of 2013, where he led during the last four years a group dedicated to developing special CMOS process modules for high-performance photodetection devices, pixel structures and imagers. Prior to his current position, he was with the Central Institute of Engineering, Electronics and Analytics, ZEA-2 - Electronic Systems of the research centre Forschungszentrum Jülich in Jülich, Germany, where he headed between 2015 and beginning of 2018 the development of Detector Systems dedicated to scientific applications. He received the Duisburger Sparkasse Award for outstanding Ph.D. thesis in 2009 and two best paper awards. He has authored and co-authored more than 60 technical papers and three book chapters, and holds six patents in the area of CMOS image sensors. He is Member of the IEEE since 2009, and forms part of the National System for Researchers (SNI) in Mexico since 2014.
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Product details
Series: Woodhead Publishing Series in Electronic and Optical Materials (Book 60)
Hardcover: 476 pages
Publisher: Woodhead Publishing; 1 edition (May 28, 2014)
Language: English
ISBN-10: 0857095986
ISBN-13: 978-0857095985
Product Dimensions:
6.5 x 1.5 x 9.8 inches
Shipping Weight: 1.8 pounds (View shipping rates and policies)
Average Customer Review:
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Amazon Best Sellers Rank:
#2,126,055 in Books (See Top 100 in Books)
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